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- Dynamic transfer applied to secondary ion imaging over large scanned fields with the nanoSIMS 50 at high mass resolution
Dynamic transfer applied to secondary ion imaging over large scanned fields with the nanoSIMS 50 at high mass resolution
1 déc. 2017Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Auteurs
Georges Slodzian, Ting-Di Wu, Jean Duprat, Cécile Engrand, Jean-Luc Guerquin-Kern
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