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- Fast automatic multiscale electron tomography for sensitive materials under environmental conditions
Fast automatic multiscale electron tomography for sensitive materials under environmental conditions
Résumé
Abstract
The demand for characterisation of beam-sensitive samples at the nanoscale in environmental conditions is increasing for applications in materials science and biology. Here we communicate a protocol with custom software, enabling precise control over the electron microscope, and a custom sample holder, facilitating automated acquisition of fast 3D data from a single object under environmental conditions. This method enables imaging with a controlled electron dose and multi-modal electron signals. The method can be used in environmental scanning or transmission electron microscopes for easy sample preparation and to benefit from high spatial resolution, respectively. To demonstrate its effectiveness, we investigate the porosity of Al(OH)